Press Releases

Nearfield Instruments and Singapore’s A*STAR IME Sign Research Collaboration Agreement to Advance Semiconductor Metrology Solutions for AI and Advanced Packaging Era

SINGAPORE, May 20, 2025 (GLOBE NEWSWIRE) — Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies.

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